HAST – Highly Accelerated Stress Test Chambers
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HAST. Highly AcceleratedStress Test Chambers.
Designed for consistent, repeatable results
HAST chambers reduce the time it takes to complete humidity testing for semiconductors. By elevating temperatures above 100°C and increasing the pressure, simulation of normal humidity tests can be made while maintaining the same failure mechanisms. Tests can be completed in days, not weeks.
Operation Features
Unsaturated or saturated humidity control
Multi-mode M System (wet bulb/dry bulb) controls humidity, even during heat-up and cool-down. Fully conforms to EIA/JEDEC Test Method A110 & 102C.
Programmable controller with temperature, humidity, and count-down display. Stores up to 10 test profiles, with 30 steps per profile.
12 Specimen power terminals, allows power-up of specimens (12 per workspace on “double” units)
Two feed-through ports, each 0.75″ NPT
Automatic fill of the humidity water at the start of a test (except TPC)
Cabinet Features
Inner cylinder and door shield protect specimens from dew condensation
Interior is shaped more like a square for easier product loading (TPC model is cylindrical)
Two stainless steel shelves
Set of casters for easy movement of the chamber (except double-stacked models)
Push button door lock (except TPC)
Bottom of the unit allows storage space for peripheral equipment
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