Compact SWIR spectroscopy modules improve signal quality for accessible material analysis

Upgraded MEMS-FPI design delivers higher signal-to-noise ratio and improved stray-light suppression

Hamamatsu Photonics announces an upgraded version of its MEMS-FPI spectroscopic modules. Designed for short-wave infrared (SWIR) analysis, the C17752, C17753 and C17754 compact sensors offer improved signal-to-noise performance and enhanced stray-light rejection, supporting more reliable material analysis in cost-sensitive and space-constrained applications.

Key Benefits
The updated MEMS-FPI modules introduce design enhancements that improve measurement stability and spectral clarity. These spectroscopic modules are engineered to support efficient SWIR analysis while keeping integration complexity and cost low.

Key benefits include:

Improved signal-to-noise performance supports stable and repeatable spectral measurements
Enced stray-light suppression contributes to clearer spectral data
Compact, integrated design enables use in space-constrained and embedded systems

Optional fiber adapter with integrated lens supports transmission measurements and flexible system design
USB plug-and-play operation allows quick setup without complex optical alignment•
Cost-efficient solution for accessible SWIR spectroscopy

Target Applications

The upgraded MEMS-FPI module supports a range of industrial and analytical applications, including:

Material sorting
Quality control and inspection
Process monitoring
Embedded and portable spectrosc